New PAT Technique Developed By METTLER TOLEDO Indicates How Particle Size, Shape and Concentration Change in Real Time

(PRWEB) April 14, 2015 METTLER TOLEDO is pleased to announce that the Relative Backscatter Index (RBI) technique is now available. Developed by METTLER TOLEDO for scientists developing and manufacturing particles, crystals and droplets, RBI is a new PAT technique that shows how particle size, shape and concentration change in real-time. Unlike turbidity measurements which […]

New Software From METTLER TOLEDO Allows Scientists to Study Particle Size, Shape and Concentration In Real Time

(PRWEB) February 03, 2015 METTLER TOLEDO is pleased to announce that iC PVM software is now available. iC PVM allows scientists to acquire comprehensive process knowledge by viewing particles in real time using an intuitive interface. Combined with the next-generation inline PVM tool, ParticleView V19 with PVM technology, iC PVM continuously captures high-resolution images under […]