New PAT Technique Developed By METTLER TOLEDO Indicates How Particle Size, Shape and Concentration Change in Real Time

(PRWEB) April 14, 2015 METTLER TOLEDO is pleased to announce that the Relative Backscatter Index (RBI) technique is now available. Developed by METTLER TOLEDO for scientists developing and manufacturing particles, crystals and droplets, RBI is a new PAT technique that shows how particle size, shape and concentration change in real-time. Unlike turbidity measurements which […]